Description
OBLF’s VeOS semiconductor-based detector system has an analytical performance which includes the spectral resolution required for a laboratory spectrometer, and is as good as established photomultiplier-based systems. The brand new photo-detector technology was specifically developed for spark emission spectroscopy.
Guaranteed Results
The design of the light-sensitive detectors, which are characterized by a surface that is 100 times more sensitive than detectors found in conventional systems, was specially adapted to suit the requirements of emission spectroscopy. The result is the first device to offer the best possible combination of spectral sensitivity and spectral resolution along with an innovative design that both guarantees OBLF’s well-known quality and the greatest flexibility of use.
Short Analysis Times
The digital GDS III excitation creates short analysis times, and enables optimized spark discharges to be generated for any given application.
Maintenance Free
Subsequent extensions of the analytical capabilities are easily possible without having to make major system changes. As in all OBLF spectrometers, the VeOS makes use of maintenance-free, digital GDS III excitation. Thanks to OBLF’s patented automatic pulse cleaning system, the optimised spark stand only requires very infrequent maintenance and can be operated at low cost.

Easy to Operate
The VeOS model comes in a new, operator-friendly housing. Being both simple to operate and of compact, solid design, the spectrometer is highly suitable for use in production environments but also for goods receipt and materials control purposes as well as in test labs with diverse analytical tasks.
Features
- Complete and flexible inclusion of all analytical tasks
- Easily extendable features
- The latest, specially developed detector technology
- Excellent performance with regard to detection limit, precision, stability
- Robust design for use in heavy-duty environments
- Most comprehensive multi-matrix application options without any restrictions regarding the selection of elements for analysis
- Accurate detection of N and traces of carbon (ULC)