OBLF VeOS: Semiconductor OES with Lab-Grade Spectral Resolution
The VeOS introduces a brand-new photo-detector technology developed specifically for spark emission spectroscopy — delivering the spectral sensitivity and resolution of a full laboratory spectrometer in a compact, maintenance-free design.
OBLF’s VeOS semiconductor-based detector system offers analytical performance that equals established photomultiplier-based systems, while introducing detectors with surface sensitivity 100 times greater than conventional systems. This makes it the first spectrometer to achieve the best possible combination of spectral sensitivity and spectral resolution.
Digital GDS III excitation delivers short analysis times and optimized spark discharges for any application. OBLF’s patented automatic pulse cleaning system means the spark stand requires very infrequent maintenance at low operating cost. The operator-friendly housing is compact, solid, and suitable for production environments, goods receipt, materials control, and test labs with diverse analytical tasks.
Capable of: Complete multi-matrix analytical tasks · Light element analysis (N, ULC carbon traces) · All element selections without restriction · Heavy-duty production environments
Key strengths: Excellent detection limit, precision, and stability · Innovative detector technology · Easily extendable features
- Detector: Proprietary semiconductor-based (100× surface sensitivity vs. conventional)
- Excitation: Maintenance-free digital GDS III
- Spark stand cleaning: Automatic pulse cleaning (patented)
- Housing: Compact, operator-friendly design
